Referring to
Since the semiconductor device package 200 includes the insulating reflection layer 230 provided around the light emitting device 100 between the first electrode unit 210 and the second electrode unit 220 and having a polygonal shape, a region of each of the first and second electrode units 220 and 230 where discoloration may occur may be minimized, and moreover, the insulating reflection layer 230, which may have good thermal and electrical reliability, may be provided around the light emitting device 100, thereby solving a problem where light speed may be reduced due to discoloration of a plating layer of a substrate and a problem where electrical reliability may be reduced due to a discoloration of a plating layer of a substrate.