In some embodiments, the comb error measurement circuitry 140, repetition rate control circuitry 150, and carrier envelope offset control circuitry 160 may be part of a single unit. The single unit may include a printed circuit board, a system on a chip, a field-programmable gate array, or other electronic system, such as may include circuitry contained in a package. By including the error measurement and control circuitry 130 in a single electronic package, the size and weight of the optical frequency comb locking system 100? may be significantly reduced compared to large laboratory systems currently used for optical frequency comb locking. Also, the power consumption of the error measurement and control circuitry 130 may be reduced relative to other error measurement and control circuitry of other optical frequency comb locking systems.

FIG. 2 illustrates, by way of example, a diagram of an embodiment of quadrature demodulation circuitry 200. The quadrature demodulation circuitry may provide a phase error measurement 220 of an input signal 210. The quadrature demodulation circuitry 200 illustrated may be a part of the beat tone digital phase detector 142 and/or the carrier envelope offset tone digital phase detector 143 of FIG. 1 in some embodiments.