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Laterally grown edge emitting laser

專利號(hào)
US10096975B1
公開日期
2018-10-09
申請(qǐng)人
INTERNATIONAL BUSINESS MACHINES CORPORATION(US NY Armonk)
發(fā)明人
Effendi Leobandung; Ning Li
IPC分類
H01S5/343; H01S5/30; H01S5/02
技術(shù)領(lǐng)域
layer,iii,doped,cladding,optical,dielectric,may,substrate,structure,silicon
地域: NY NY Armonk

摘要

A laterally grown edge emitting laser is provided. A semiconductor structure is disposed on a substrate. A first, a second and a third III-V optical layers are sequentially and laterally grown on and from a sidewall of the semiconductor structure. A cladding semiconductor layer is disposed next to the third III-V optical layer and electrically connected to the III-V optical layer. Then, a first contact structure and a second contact structure is disposed on and electrically connected to the semiconductor structure and the cladding semiconductor layer, respectively. In the edge emitting laser, each of the first, second and third III-V optical layers may independently include a III-V semiconductor including at least one of group III elements of boron (B), gallium (Ga), aluminum (Al) and indium (In), and at least one of group V elements of nitrogen (N), phosphorus (P), arsenic (As), antimony (Sb) and bismuth (Bi). The laterally grown edge emitting laser may be integrated with a metal-oxide-semiconductor field-effect transistor (MOSFET). A method for manufacturing the laterally grown edge emitting laser is also provided.

說明書

According to an exemplary embodiment of the present invention, a method for manufacturing edge emitting lasers may include the following steps: providing a semiconductor substrate; forming a hard mask layer on top of the semiconductor substrate, the hard mask layer arranged in a first direction, and extending in a second direction; etching the semiconductor substrate using the hard mask layer as an etching mask to form a semiconductor structure protruding above the semiconductor substrate in a third direction, perpendicular to the first and second directions; forming a first dielectric layer over the semiconductor substrate, the first dielectric layer having a top surface lower than a top surface of the semiconductor structure, so as to expose sidewalls of the semiconductor structure above the first dielectric layer; implanting n-dopant to the semiconductor structure to form n-doped semiconductor in the semiconductor structure; laterally growing a first III-V optical layer, a second III-V optical layer and a third III-V optical layer sequentially on and from each of the exposed sidewalls of the semiconductor structure, the first, second and third III-V optical layers extending in the second direction; forming p-doped cladding semiconductor layers directly connected to exposed sidewalls of the third III-V optical layers and extending in the second direction; forming a second dielectric layer to cover the first dielectric layer, the hard mask layer, the semiconductor structure, the p-doped cladding semiconductor layer, and the first, second and third III-V optical layers; and forming a first contact structure through the second dielectric layer and the hard mask layer to connect the semiconductor structure, and second contact structures through the second dielectric layer to connect the p-doped cladding semiconductor layers. The sequence of the steps as described above is preferred. However, the invention is not limited to the performance of these steps with the sequence or order presented above. Many steps may also be applied to the semiconductor substrate before, between or after the steps shown above. FIG. 2 is a flow chart of a method for making edge emitting lasers on a semiconductor substrate according to an exemplary embodiment of the present invention. FIGS. 3A-7A and FIGS. 3B-7B are demonstrative illustrations of cross-sectional views or top views of structures in the method of manufacturing the edge emitting laser according to an exemplary embodiment of the present invention.

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