Some embodiments of the present disclosure may be illustrated as a voltage controller. The voltage controller may be configured to measure, at the beginning of a first measurement cycle in a cyclic measurement pattern, a first voltage at a load device. The voltage controller may also be configured to measure, at the beginning of a second measurement cycle in the cyclic measurement pattern, a second voltage at the load device. The voltage controller may be configured to detect a rate of change in voltage based on the first and second voltages, and to determine that the rate of change is below a voltage-change threshold. The voltage controller may further be configured to control, based on that determining, the voltage according to a steady-state cyclic control pattern. The cyclic measurement pattern may operate at a first frequency. the steady-state cyclic control pattern may operate at a second frequency. The first frequency may be a positive-integer multiple of the second frequency. The first positive-integer multiple may be greater than 1.
The above summary is not intended to describe each illustrated embodiment or every implementation of the present disclosure.
The drawings included in the present application are incorporated into, and form part of, the specification. They illustrate embodiments of the present disclosure and, along with the description, serve to explain the principles of the disclosure. The drawings are only illustrative of certain embodiments and do not limit the disclosure.