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Melt depth determination using infrared interferometric technique in pulsed laser annealing

專利號
US10219325B2
公開日期
2019-02-26
申請人
Jiping Li(US CA Santa Clara)
發(fā)明人
Jiping Li
IPC分類
H05B6/00; G01B11/06; H01L21/67
技術(shù)領(lǐng)域
radiation,substrate,radiant,coherent,can,melted,surface,detector,be,melt
地域: CA CA Palo Alto

摘要

Methods and apparatus for measuring the melt depth of a substrate during pulsed laser melting are provided. The apparatus can include a heat source, a substrate support with an opening formed therein, and an interferometer positioned to direct coherent radiation toward the toward the substrate support. The method can include positioning the substrate with a first surface in a thermal processing chamber, heating a portion of the first surface with a heat source, directing infrared spectrum radiation at a partially reflective mirror creating control radiation and interference radiation, directing the interference radiation to a melted surface and directing the control radiation to a control surface, and measuring the interference between the reflected radiation. The interference fringe pattern can be used to determine the precise melt depth during the melt process.

說明書

Radiation is coherent when there is a fixed phase relationship between the electric field values at different locations or at different times. The fixed phase relationship can be separated into a spatial relationship (a.k.a. spatial coherence) and a temporal relationship (a.k.a. temporal coherence). Partial coherence means that there is at least some correlation between phase values, either spatial coherence, temporal coherence or combinations thereof. In embodiments described herein, coherent radiation can be either coherent or partially coherent. In the case of coherent radiation used in combination with the interferometer, the coherency of the radiation is only limited by the ability of the interferometer to differentiate between interference patterns from the reflected radiation.

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