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Systems and methods for real-time DC microgrid power analytics for mission-critical power systems

專利號(hào)
US10867087B2
公開日期
2020-12-15
申請人
WaveTech Global Inc.(US NJ Hoboken)
發(fā)明人
Kevin Meagher; Brian Radibratovic; Adib Nasle
IPC分類
G06F17/50; G06F30/20; H02J13/00; H04L29/08; G06F30/00; G05F1/66; H02J3/00; G06F30/367; G06F119/06
技術(shù)領(lǐng)域
system,analytics,power,in,data,electrical,real,virtual,can,be
地域: NJ NJ Hoboken

摘要

Systems and methods for performing power analytics on a microgrid. In an embodiment, predicted data is generated for the microgrid utilizing a virtual system model of the microgrid, which comprises a virtual representation of a topology of the microgrid. Real-time data is received via a portal from at least one external data source. If the difference between the real-time data and the predicted data exceeds a threshold, a calibration and synchronization operation is initiated to update the virtual system model in real-time. Power analytics may be performed on the virtual system model to generate analytical data, which can be returned via the portal.

說明書

FIG. 12 is a diagram illustrating an example process for determining the protective capabilities of a HVCB. In certain embodiments, X/R can be calculated in step 1157 and a peak current (Ipeak) can be determined using equation 11 in step 1158. In step 1162, it can be determined whether the HVCB's rating is greater than or equal to Ipeak as determined in step 1158. If the device rating is greater than or equal to Ipeak, then the device has passed in step 1164. Otherwise, the device fails in step 1166. In either case, the percent rating can be determined in step 1168 using the following:

% ? ? rating = I MAX Device ? ? rating

In other embodiments, an interrupting time calculation can be made in step 1170. In such embodiments, a fault X/R can be calculated and then can be determined if the fault X/R is greater than or equal to a circuit breaker test X/R in step 1172. For example, the following circuit breaker test X/R can be used;

    • 50 Hz Test X/R=13.7
    • 60 Hz Test X/R=16.7
    • (DC Time Constant=0.45 ms)

權(quán)利要求

1
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