Panel inspection method
地域：
Wuhan
摘要
A panel inspection method is provided, including: S10: providing a host and at least two optical probes; S20: sending, by the host, a lighting command and inputting a common electrode voltage to the panel group; S30: inspecting, by each of the optical probes, respectively a flicker value of any panel in the panel group and returning the value to the host; S40: determining, by the host, whether the flicker value is an optimal flicker value.
說(shuō)明書
This application is a National Phase of PCT Patent Application No. PCT/CN2019/086743 having International filing date of May 14, 2019, which claims the benefit of priority of Chinese Patent Application No. 201811639294.7 filed on Dec. 29, 2018. The contents of the above applications are all incorporated by reference as if fully set forth herein in their entirety.
The present invention relates to the field of display technologies, and in particular, to a panel inspection method.
權(quán)利要求
What is claimed is:1. A panel inspection method, comprising:S10: providing a host and an optical probe set, where the optical probe set includes at least two optical probes, and the optical probes are connected to the host through USB cables, for inspecting flicker values of panels in a panel group; S20: sending a lighting command and inputting a common electrode voltage to the panels in the panel group by the host; S30: inspecting a flicker value of any one of the panels in the panel group and returning the flicker value to the host by each of the optical probes, respectively; S40: determining, by the host, whether the flicker value is an optimal flicker value; S50: if the host determines that the flicker value is the optimal flicker value, the host records a common electrode voltage corresponding to the optimal flicker value of the one of the panels as an optimal common electrode voltage of the one of the panels, and the optimal common electrode voltage is programmed in the one of the panels; and S60: if the host determines that the flicker value is not the optimal flicker value, the host adjusts an input common electrode voltage value, and repeats steps S20 to S40 until the host determines that the flicker value is the optimal flicker value. 2. The panel inspection method as claimed in claim 1 , wherein if the any one of the panels in the panel group has been programmed with the optimal common electrode voltage in step S50, a next one of the panels is transmitted for complement inspection. 3. The panel inspection method as claimed in claim 1 , wherein a number of the optical probes is equal to a number of the panels in the panel group in step S30. 4. The panel inspection method as claimed in claim 1 , wherein a method of determining the optimal flicker value is to obtain a minimum flicker value by comparison in step S40, and the minimum flicker value is the optimal flicker value. 5. The panel inspection method as claimed in claim 1 , wherein an adjustment range of the input common electrode voltage value adjusted by the host is selected from back and forth with the optimal common electrode voltage as a center value in step S60. 6. A panel inspection method, comprising:S101: collecting a range of an optimal common electrode voltage of panels in a same batch, that is, a maximum optimal common electrode voltage value and a minimum optimal common electrode voltage value; S102: extracting a central value in the range; S103: confirming a flicker value difference with a largest difference between flicker values of any one of the panels corresponding to the central value in the same batch; S104: sending a lighting command and inputting the center value to the any one of the panels by a host; S105: reading back the flicker values through an optical probe set by the host, and performing subtraction operations with respect to each other between the flicker values; S106: comparing a value difference with the flicker value difference; S107: if the value difference is greater than the flicker value difference, alarming to notify an engineer to calibrate the optical probe set or check connections; S108: if the value difference is less than the flicker value difference, finding the optimal common electrode voltage and an optimal flicker value; S109: after finding the optimal common electrode voltage, confirming whether the optimal common electrode voltage is within the range; S110: if within the range, shipping out goods normally; and S111: if not within the range, repeating the steps S107 to S109 until the optimum common electrode voltage is within the range. 7. The panel inspection method as claimed in claim 6 , wherein the optical probe set includes at least two optical probes in S105, and a number of the flicker values is equal to a number of the optical probes. 8. The panel inspection method as claimed in claim 6 , wherein all the read flicker values are subtracted one by one to obtain a maximum value difference in S105. 9. The panel inspection method as claimed in claim 6 , wherein the optimal flicker value is first found in S108, and after the optimal flicker value is found, the optimal common electrode voltage is a one corresponding to the optimal flicker value. 10. The panel inspection method as claimed in claim 6 , wherein a method of finding the optimal flicker value in S108 is to obtain a minimum flicker value by comparison, and the minimum flicker value is the optimal flicker value.
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