S206: if the host determines that the flicker value is not an optimal flicker value, the host adjusts an input common electrode voltage value, and repeats steps S202 to S205 until the host determines that the flicker value is an optimal flicker value.

In this embodiment, if any panel in the panel group has been programmed with the optimal common electrode voltage in step S202, the next panel is transmitted for complement inspection; the number of optical probes is equal to the number of panels in the panel group in step S203; the method of determining the optimal flicker value is to obtain a minimum flicker value by comparison in step S204, and the minimum flicker value is the optimal flicker value; in step S206, an adjustment range of the host adjusting input common electrode voltage values is selected back and forth with the optimal common electrode voltage as a center value.

FIG. 3 is a flowchart of a panel inspection method according to a second embodiment of the present invention. The inspection method includes the following:

S301: collecting a range of optimal common electrode voltages of the same batch of panels, that is, a maximum optimal common electrode voltage value and a minimum optimal common electrode voltage value;

S302: extracting a central value in the range;

S303: confirming a difference of a flicker value that has the largest difference between the flicker values of any panel corresponding to the central value in the same batch of panels;

S304: sending, by a host, a lighting command and inputting the center value to any panel;