An embodiment of the present invention provides a panel inspection method, the method comprising:

S10: providing a host and an optical probe set, where the optical probe set includes at least two optical probes, and the optical probes are connected to the host through USB cables, for inspecting flicker values of the panels;

S20: sending, by the host, a lighting command and inputting a common electrode voltage to the panel group;

S30: inspecting, by each of the optical probes, respectively a flicker value of any panel in the panel group and returning the value to the host;

S40: determining, by the host, whether the flicker value is an optimal flicker value;

S50: if the host determines that the flicker value is an optimal flicker value, the host records a common electrode voltage corresponding to the optimal flicker value of the panel as an optimal common electrode voltage of the panel, and the optimal common electrode voltage is programmed in the panel;

S60: if the host determines that the flicker value is not an optimal flicker value, the host adjusts an input common electrode voltage value, and repeats steps S20 to S40 until the host determines that the flicker value is an optimal flicker value.

In the panel inspection method provided by the embodiment of the present invention, if any panel in the panel group has been programmed with the optimal common electrode voltage in step S20, the next panel is transmitted for complement inspection.

In the panel inspection method provided by the embodiment of the present invention, the number of optical probes is equal to the number of panels in the panel group in step S30.