In the panel inspection method provided by the embodiment of the present invention, the method of determining the optimal flicker value is to obtain a minimum flicker value by comparison in step S40, and the minimum flicker value is the optimal flicker value.

In the panel inspection method provided by the embodiment of the present invention, an adjustment range of the host adjusting input common electrode voltage values is selected back and forth with the optimal common electrode voltage as a center value in step S60.

An embodiment of the invention further provides a panel inspection method, the method comprising:

S101: collecting a range of optimal common electrode voltages of the same batch of panels, that is, a maximum optimal common electrode voltage value and a minimum optimal common electrode voltage value;

S102: extracting a central value in the range;

S103: confirming a difference of a flicker value that has the largest difference between the flicker values of any panel corresponding to the central value in the same batch of panels;

S104: sending, by a host, a lighting command and inputting the center value to any panel;

S105: using, by the host, an optical probe set to read back the flicker values and performing subtraction operations on each other;

S106: comparing the difference with the difference of the flicker value;

S107: if the difference is greater than the difference of the flicker value, an alarm notifies an engineer to correct the probe or check connection;