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Panel inspection method

專利號(hào)
US10867564B2
公開(kāi)日期
2020-12-15
申請(qǐng)人
Wuhan China Star Optoelectronics Technology Co., Ltd.（CN Wuhan）
發(fā)明人
Chunpeng Guo
IPC分類
G09G3/36; G01R31/308
技術(shù)領(lǐng)域
flicker,panel,optimal,host,value,probe,inspection,electrode,optical,voltage
地域： Wuhan

摘要

A panel inspection method is provided, including: S10: providing a host and at least two optical probes; S20: sending, by the host, a lighting command and inputting a common electrode voltage to the panel group; S30: inspecting, by each of the optical probes, respectively a flicker value of any panel in the panel group and returning the value to the host; S40: determining, by the host, whether the flicker value is an optimal flicker value.

說(shuō)明書(shū)

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The beneficial effect of the present invention is as follows: A panel inspection method provided by the embodiment of the present invention switches a mode in which a host corresponds to one optical probe to a mode in which a host corresponds to two or more optical probes, thereby avoiding flickering abnormalities caused by abnormality of the probe itself or poor connection of the connecting wires, achieving the technical effect of improving module production yield.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the present invention. Other drawings can also be obtained from those skilled in the art based on these drawings without paying any creative effort.

FIG. 1 is a structural diagram of a fixture for inspecting a panel flicker value according to an embodiment of the present invention;

FIG. 2 is a flowchart of a panel inspection method according to a first embodiment of the present invention;

FIG. 3 is a flowchart of a panel inspection method according to a second embodiment of the present invention.

 DESCRIPTION OF SPECIFIC EMBODIMENTS OF THE INVENTION

權(quán)利要求

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