In this embodiment, the host 101 connects two or more optical probes to inspect the flicker values of the panels. By comparing the collected flicker values, it is avoided that when a host corresponds to one optical probe mode, the inspected flicker value is inaccurate due to abnormality of the probe itself or poor connection of the connecting wire. It can also improve the inspection efficiency.

FIG. 2 is a flowchart of a panel inspection method according to a first embodiment of the present invention. The inspection method includes the following:

S201: providing a host and an optical probe set, where the optical probe set includes at least two optical probes, and the optical probes are connected to the host through USB cables, for inspecting flicker values of the panels;

S202: sending, by the host, a lighting command and inputting a common electrode voltage to the panel group;

S203: inspecting, by each of the optical probes, respectively a flicker value of any panel in the panel group and returning the value to the host;

S204: determining, by the host, whether the flicker value is an optimal flicker value;

S205: if the host determines that the flicker value is an optimal flicker value, the host records a common electrode voltage corresponding to the optimal flicker value of the panel as an optimal common electrode voltage of the panel, and the optimal common electrode voltage is programmed in the panel;