The atomic ratio of Ti to the total amount of Ti and Cr contained in the first seed layer 113A is preferably in the range of 30 atomic % or more and less than 100 atomic %, more preferably 50 atomic % or more and less than 100 atomic %. When the atomic ratio of Ti is less than 30%, the (100) plane of the body-centered cubic lattice (bcc) structure of Cr will be oriented, and there is a possibility that the first and second base layers 114A and 114B formed on the first seed layer 113A may have an orientation degraded.
The above-mentioned atomic ratio of Ti is determined as follows. A depth profile analysis (depth profile measurement) of the first seed layer 113A by Auger Electron Spectroscopy (hereinafter referred to as “AES”) is made while ion-milling the magnetic recording medium 110 from the side of the recording layer 115. Next, the average composition (average atomic ratio) of Ti and Cr in the film thickness direction is determined from the obtained depth profile. Next, the above-determined atomic ratio of Ti is determined with the use of the obtained average composition of Ti and Cr.