Method for testing a memory device
摘要
說明書
The XPM from Example 1 was reconnected to setup of Example 2. A read was taken with the parameters of Example 2. Their values are in Table 4. They are the capacitive loads of the leads and cells. Since the capacitive load of the leads are so small they can be neglected. Since every read is significantly larger than those in Table 3 the interpretation is that every single cell is connected. This also means that every word line and bit line is connected; hence, the XPM is present and well connected. The values in Table 3 are smaller than the second reads in Table 1 because the driving voltage is smaller. It is small to stay below the threshold of switching. However, even small voltages may be able to switch the polarization if they are long enough present. For this reason the pulse width was held short as well. Capacitive loads are only sensitive to the RC time constant which in this case is at least an order smaller.
