The first test response and the second test response that are output by the test cell are integrated to a charge through an integrating OpAmp arranged within an Application Specific Integrated Circuit (ASIC). The charge is read on a capacitor in the circuit as a voltage that gets converted into a digital value.

In some examples, the host controller is configured to output a result of the testing for the test call based on the comparing. In some examples, the first predetermined threshold is a digital value that represents a charge of about 0.1 nC to about 1 nC. In some examples, the first test voltage and the second test voltage that are received by the test cell are a first read operation and a second read operation, respectively, that are performed using a voltage that is less than a voltage that would change a state of the test cell. In some examples, the second predetermined threshold is a digital value that represents a charge of about 9 nC to about 11 nC or larger. In some examples, the first predetermined threshold and the second predetermined threshold are based on the characteristics of the test cell. In some examples, the result is that the test cell is not properly connected if the first digital value and the second digital value do not meet the first predetermined threshold and the second predetermined threshold. In some examples, the result is that the test cell is properly connected if the first digital value and the second digital value meet the first predetermined threshold and the second predetermined threshold. In some examples, the first test voltage and the second test voltage are the same.