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Apparatus and methods for controlling refresh operations

專利號(hào)
US10867660B2
公開日期
2020-12-15
申請(qǐng)人
MICRON TECHNOLOGY, INC.(US ID Boise)
發(fā)明人
Hiroshi Akamatsu
IPC分類
G11C7/00; G11C11/408; G11C5/04; G11C5/06; G11C29/18; G11C29/00; G11C8/12
技術(shù)領(lǐng)域
word,row,address,rwlj,radd2,redundant,refresh,circuit,signal,target
地域: ID ID Boise

摘要

An apparatus includes a first word line, a second word line and a control. The second word line is contiguous to the first word line. The control circuit includes a first defective address storing circuit and a first detection circuit. The first defective address storing circuit stores first enable information along with first defective address. The first enable information indicates whether or not the second word line is functional. The first detection circuit provides a first signal when the first word line is accessed. The first signal indicates whether or not the second word line is functional. The control circuit activates the second word line when the first signal indicates that the second word line is functional and does not activate the second word line when the first signal indicates that the second word line is not functional.

說(shuō)明書

The read/write signal iW/R is activated when the internal command/address signal iC/A is indicating a read command or a write command. When the internal command/address signal iC/A is indicating the read command or the write command, the column control signal CCTL is also activated. When the read/write signal iW/R is activated, a column address contained in the internal command/address signal iC/A is latched by the address latch circuit 26. The column address CADD latched by the address/latch circuit 26 is supplied to a column control circuit 29. When the column control signal CCTL is activated, the column control circuit 29 selectively connects any of a plurality of bit lines BL, which are contained in the memory cell array 20, to a corresponding sense amplifier SA based on the column address CADD. FIG. 1 shows a single bit line BL in the memory cell array 20. However, in practice, many bit lines BL are provided. The bit lines BL are connected to sense amplifiers SA, and read or write of the data signals DATA is carried out via the sense amplifiers SA.

More specifically, in a read operation, the data signal DATA is read from a normal memory cell MC disposed at the intersection point of the selected normal word line WL and the selected bit line BL or a redundant memory cell RMC disposed at the intersection point of the selected redundant word line RWL and the selected bit line BL, and the data signal DATA is output to outside via the data control circuit 21 and the data input/output circuit 22.

權(quán)利要求

1
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