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E-beam apparatus

專(zhuān)利號(hào)
US10867770B2
公開(kāi)日期
2020-12-15
申請(qǐng)人
ASML Netherlands B.V.(NL Veldhoven)
發(fā)明人
Peter Paul Hempenius; Sven Antoin Johan Hol; Maarten Frans Janus Kremers; Henricus Martinus Johannes Van De Groes; Niels Johannes Maria Bosch; Marcel Koenraad Marie Baggen
IPC分類(lèi)
H01J37/20; H01J37/09; H01J37/317
技術(shù)領(lǐng)域
shield,stroke,beam,electron,magnetic,stage,optics,object,table,stray
地域: AH Veldhoven

摘要

An e-beam apparatus is disclosed, the tool comprising an electron optics system configured to project an e-beam onto an object, an object table to hold the object, and a positioning device configured to move the object table relative to the electron optics system. The positioning device comprises a short stroke stage configured to move the object table relative to the electron optics system and a long stroke stage configured to move the short stroke stage relative to the electron optics system. The e-beam apparatus further comprises a magnetic shield to shield the electron optics system from a magnetic disturbance generated by the positioning device. The magnetic shield may be arranged between the positioning device and the electron optics system.

說(shuō)明書(shū)

Hence, the magnetic shield extends along the field of view of the electron optics system 500, i.e. the field of view for disturbances from stray magnetic fields. Furthermore, as the magnetic shield moves with the positioning device 510, a maximum movement length of the positioning device 510 is taken into account. Hence, at each position of the object table 520 within the (maximum) movement length, the field of view of the electron optics system 500 is faced with the magnetic shield. It will be understood that the term length may be applied to the x direction as well as to the y direction. Thus, the length may be understood is x direction or in y direction. For the sake of completeness, it is noted that the x and y direction may be understood as directions spanning a plane substantially parallel to a surface of the object to be inspected, while the z-direction may be understood as a direction perpendicular to the plane spanned by the x and y directions.

權(quán)利要求

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