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Electrospray ionization interface to high pressure mass spectrometry and related methods

專利號(hào)
US10867781B2
公開日期
2020-12-15
申請(qǐng)人
The University of North Carolina at Chapel Hill(US NC Chapel Hill)
發(fā)明人
John Michael Ramsey; William McKay Gilliland, Jr.
IPC分類
H01J49/16; H01J49/24; H01J49/00; H01J49/04; B01L3/00
技術(shù)領(lǐng)域
mass,esi,analyzer,about,mm,inlet,chamber,ion,vacuum,trap
地域: NC NC Chapel Hill

摘要

An electrospray ionization (ESI)-mass spectrometer analysis systems include an ESI device with at least one emitter configured to electrospray ions and a mass spectrometer in fluid communication with the at least one emitter of the ESI device. The mass spectrometer includes a mass analyzer held in a vacuum chamber. The vacuum chamber is configured to have a high (background/gas) pressure of about 50 mTorr or greater during operation. During operation, the ESI device is configured to either; (a) electrospray ions into a spatial region external to the vacuum chamber and at atmospheric pressure, the spatial extent being adjacent to an inlet device attached to the vacuum chamber, the inlet device intakes the electrosprayed ions external to the vacuum chamber with the mass analyzer and discharges the ions into the vacuum chamber with the mass analyzer; or (b) electrospray ions directly into the vacuum chamber with the mass analyzer.

說明書

FIG. 21 is a graph of normalized intensity (arbitrary units) versus m/z for different RF drive frequencies and different critical r0 values at 1.0 Torr, with ambient air as the buffer gas, according to embodiments of the present invention.

DESCRIPTION OF EMBODIMENTS OF THE INVENTION

The present invention will now be described more fully hereinafter with reference to the accompanying figures, in which embodiments of the invention are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Like numbers refer to like elements throughout. In the figures, certain layers, components or features may be exaggerated for clarity, and broken lines illustrate optional features or operations unless specified otherwise. In addition, the sequence of operations (or steps) is not limited to the order presented in the figures and/or claims unless specifically indicated otherwise. In the drawings, the thickness of lines, layers, features, components and/or regions may be exaggerated for clarity and broken lines illustrate optional features or operations, unless specified otherwise. The abbreviations “Fig.” and “FIG” are used interchangeably with the word “Figure” in the drawings and specification.

權(quán)利要求

1
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