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Silicon carbide semiconductor device and a method of manufacturing the silicon carbide semiconductor device

專利號(hào)
US10868122B2
公開日期
2020-12-15
申請(qǐng)人
FUJI ELECTRIC CO., LTD.(JP Kawasaki)
發(fā)明人
Takeshi Tawara; Koji Nakayama; Yoshiyuki Yonezawa; Hidekazu Tsuchida; Koichi Murata
IPC分類
H01L29/16; H01L29/868; H01L29/66
技術(shù)領(lǐng)域
layer,type,drift,lifetime,epitaxial,carbide,silicon,vanadium,region,in
地域: Kawasaki

摘要

During epitaxial growth of an n?-type drift layer having a uniform nitrogen concentration, vanadium is doped in addition to the nitrogen, whereby an n?-type lifetime reduced layer is selectively formed in the n?-type drift layer. The n?-type lifetime reduced layer is disposed at a depth that is more than 5 μm from a pn junction surface between a p-type anode layer and the n?-type drift layer in a direction toward a cathode side, and the n?-type lifetime reduced layer is disposed separated from the pn junction surface. Further, the n?-type lifetime reduced layer is disposed in a range from the pn junction surface to a depth that is ? times a thickness of the n?-type drift layer. A vanadium concentration of the n?-type lifetime reduced layer is 1/100 to ? of a nitrogen concentration of the n?-type lifetime reduced layer.

說(shuō)明書

The n-type drift layer 103 has a nitrogen concentration that is uniform from an interface 111 between the n-type buffer layer 102 and the n-type drift layer 103 to the pn junction surface 112 between the p-type anode layer 104 and the n-type drift layer 103. An anode electrode (not depicted) is in contact with the p-type anode layer 104. A cathode electrode (not depicted) is in contact with a rear surface of the n-type starting substrate 101 that constitutes an n+-type cathode layer. In FIG. 14, an edge termination structure 105 such as a junction termination extension (JTE) structure, a field limiting ring (FLR), etc. is depicted in a simplified manner.

Further, in FIG. 14, a conductivity type of the n-type starting substrate 101 is indicated by “nsub”. Further, doping of the n-type starting substrate 101, the n-type buffer layer 102, and the n-type drift layer 103 with nitrogen as a dopant is indicated by “N doped”. Doping of the n-type drift layer 103 with vanadium as a dopant is indicated by “V doped”. Doping of the p-type anode layer 104 with aluminum as a dopant is indicated by “Al doped”. Relative lengths of the carrier lifetime of the n-type drift layer 103 are indicated by “l(fā)ong carrier lifetime” and “short carrier lifetime”.

權(quán)利要求

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