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Highly strained source/drain trenches in semiconductor devices

專利號
US10868166B2
公開日期
2020-12-15
申請人
Ta-Wei Kao; Shiang-Bau Wang; Ming-Jie Huang; Chi-Hsi Wu; Shu-Yuan Ku(TW Hsin-Chu)
發(fā)明人
Ta-Wei Kao; Shiang-Bau Wang; Ming-Jie Huang; Chi-Hsi Wu; Shu-Yuan Ku
IPC分類
H01L29/76; H01L29/78; H01L29/66
技術(shù)領(lǐng)域
transistor,etch,sccm,overetch,silicon,opening,substrate,br,undercut,etching
地域: Sijhih

摘要

A semiconductor device is formed by a multi-step etching process that produces trench openings in a silicon substrate immediately adjacent transistor gate structures formed over the substrate surface. The multi-step etching process is a Br-based etching operation with one step including nitrogen and a further step deficient of nitrogen. The etching process does not attack the transistor structure and forms the openings. The openings are bounded by upper surfaces that extend downwardly from the substrate surface and are substantially vertical, and lower surfaces that bulge outwardly from the upper vertical sections and undercut the transistor structure. The openings may be filled with a suitable source/drain material to produce SSD transistors with desirable Idsat characteristics.

說明書

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The degree and shape of undercut illustrated by exemplary lower surface portion 52 is intended to be exemplary only and produces a stress in the etched surfaces. The undercut produces mesa 72 having a minimum width 74 that is less than width 82 of corresponding transistor gate 8. The curved surfaces of lower surface portions 52 of sidewalls 46 of openings 44 extend laterally inward past dashed line 48 indicating the lateral edge of transistor structure 2 and also inwardly past dashed line 76 representing sidewalls 20 of transistor gate 8. Lower surface portions 52 extend laterally inward by distance 80 with respect to the outer edges of transistor gate 8 indicated by sidewalls 20, i.e. opening 44 undercuts transistor gate 8 by distance 80 on each side. According to one exemplary embodiment, distance 80 may vary from about 5-15 nanometers, but other degrees of undercut may be produced according to other exemplary embodiments. Minimum width 74 of mesa 72 may therefore be about 10-30 nanometers less than width 82 of transistor gate 8. Such is intended to be exemplary only.

權(quán)利要求

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