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Semiconductor device having an edge termination area with trench electrodes at different electric potentials, and method for manufacturing thereof

專利號
US10868173B2
公開日期
2020-12-15
申請人
Infineon Technologies Austria AG(AT Villach)
發(fā)明人
Cedric Ouvrard; Adam Amali; Oliver Blank; Michael Hutzler; David Laforet; Harsh Naik; Ralf Siemieniec; Li Juin Yip
IPC分類
H01L29/78; H01L29/66; H01L29/739; H01L29/40; H01L29/06; H01L29/10
技術領域
spicular,doping,region,drift,trenches,trench,153a,area,substrate,in
地域: Villach

摘要

A semiconductor device includes a semiconductor substrate having drift and body regions. The drift region includes upper and lower drift regions. An active area includes a plurality of spicular trenches extending through the body region and into the drift region. Each spicular trench in the active area has a lower end which together define a lower end of the upper drift region extending towards a first side and a lower drift region extending from the lower end of the upper drift region towards a second side. The edge termination area includes spicular termination trenches extending at least into the upper drift region. A surface doping region arranged in the upper drift region in the edge termination area extends to the first side, is spaced apart from the lower end of the upper drift region, and has a net doping concentration lower than that of the upper drift region.

說明書

With reference to FIGS. 2A and 2B the differences between a transistor cell of the stripe design and a transistor cell of the trench needle design is explained in more detail. FIG. 2A shows a unit cell of the stripe design while FIG. 2B illustrates a unit cell of the trench needle design.

The transistor cell of FIG. 2A is formed in a semiconductor substrate 200 having a first side 201 and the second side. The first side 201 defines the main side or surface of the semiconductor substrate 200 while the second side defines a side opposite to the first side 201. The stripe design includes a long and deep field plate trench 230 which is formed to extend from the first side 201 of the semiconductor substrate into the semiconductor substrate 100. The field plate trench 230 has a stripe shape when seen in plain projection onto the first side 201 of the semiconductor substrate 200. Each field plate trench 230 includes a field electrode 231 which is indicated by phantom lines in FIG. 2A. The field electrode 231 has a plate-like shape parallel to the longitudinal extension of the field plate trench 230. A thick field oxide 232 electrically insulates the field electrode 231 from the semiconductor substrate 200. Next to and parallel with the field plate trench 230 is running a cell mesa region 220 extending up to the first side 201 of the semiconductor substrate 200.

權利要求

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