The average composition can be identified by combining inductively coupled plasma (ICP) emission spectroscopic analysis and ion chromatography. For example, the metal contained in a fluoride ion conductor is analyzed by ICP emission spectroscopic analysis, and fluorine is analyzed by ion chromatography.
In a second aspect of the present disclosure, the fluoride ion conductor according to the first aspect may include a phase of a compound containing rubidium, magnesium, and fluorine.
When the phase of the compound is a crystal phase, the composition and structure thereof can be identified by an X-ray diffraction method.
In a third aspect of the present disclosure, the fluoride ion conductor according to the second aspect may further include a phase of a mixture containing rubidium, magnesium, and fluorine.
The mixture may be a mixture of, for example, rubidium, magnesium, and fluorine. Alternatively, the mixture may be a mixture of, for example, a fluoride of rubidium and a fluoride of magnesium. When the phase of the mixture include a plurality of crystal phases, the compositions and structures of such phases can be identified by an X-ray diffraction method.
In a fourth aspect of the present disclosure, the ratio according to any one of the first to third aspects is 0.1 or more and 0.3 or less.
In a fifth aspect of the present disclosure, the fluoride ion conductor according to any one of the first to fourth aspects may consist of rubidium, magnesium, and fluorine.