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Shadow elimination detection method and manufacturing method for a touch substrate, touch substrate and touch device

專利號
US10980110B2
公開日期
2021-04-13
申請人
BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.(CN Beijing CN Anhui)
發(fā)明人
Wenjin Fan; Lei Zhang; Tsung Chieh Kuo; Yang Liu; Kui Lv
IPC分類
G06F3/041; H05K1/02; G02F1/1335
技術(shù)領(lǐng)域
touch,shadow,test,blocks,in,substrate,area,board,ito,laminated
地域: Beijing

摘要

The present disclosure provides a shadow elimination detection method for a touch substrate, a touch substrate manufacturing method, a touch substrate, and a touch device. The shadow elimination detection method for a touch substrate includes detecting a difference in light reflectance between test blocks with different structures located in an area outside a touch area of the touch substrate using a detection device, and determining a shadow elimination effect of the touch substrate according to the difference, wherein each of the test blocks with different structures includes a structure corresponding to a respective structure in different structures in the touch area.

說明書

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One aspect of the present disclosure provides a touch panel shadow elimination detection method which includes detecting a difference in light reflectance between test blocks with different structures located in an area outside a touch control area of a touch substrate using a detection device, and determining a shadow elimination effect of the touch substrate according to the difference, wherein each of the test blocks with different structures includes a structure corresponding to a respective structure in different structures in the touch area.

Another aspect of the present disclosure provides a method for manufacturing a touch substrate which includes forming test blocks with different structures in an area outside a touch area of a touch substrate in a manufacturing process of the touch substrate, wherein each of the test blocks with different structures includes a structure corresponding to a respective structure in different structures in the touch area.

Still another aspect of the present disclosure provides a touch substrate including test blocks with different structures located in an area outside a touch area thereof, wherein each of the test blocks with different structures includes a structure corresponding to a respective structure in different structures in the touch area.

Still another aspect of the present disclosure provides a touch device which includes the touch substrate according to any embodiment of the present disclosure.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows the internal touch area of a single OGS touch substrate;

權(quán)利要求

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