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Method for dicing integrated fan-out packages without seal rings

專利號
US11177142B2
公開日期
2021-11-16
申請人
Taiwan Semiconductor Manufacturing Company, Ltd.(TW Hsinchu)
發(fā)明人
Li-Hsien Huang; Yueh-Ting Lin; An-Jhih Su; Ming Shih Yeh; Der-Chyang Yeh
IPC分類
H01L21/56; H01L23/31; H01L25/16; H01L21/683; H01L23/00; H01L25/00
技術領域
die,dicing,conductive,molding,packages,in,pillars,dielectric,package,structure
地域: Hsinchu

摘要

A method includes attaching a first die and a second die to a carrier; forming a molding material between the first die and second die; and forming a redistribution structure over the first die, the second die and the molding material, the redistribution structure includes a first redistribution region; a second redistribution region; and a dicing region between the first redistribution region and the second redistribution region. The method further includes forming a first opening and a second opening in the dicing region, the first opening and the second opening extending through the redistribution structure and exposing the molding material; and separating the first die and the second die by cutting through a portion of the molding material aligned with the dicing region from a second side of the molding material toward the first side of the molding material, the second side opposing the first side.

說明書

As illustrated in FIG. 10, the blade 315 cuts into the dicing region 300 from a side of the semiconductor packages 1100 opposite the openings 311/313. In other words, the blade 315 starts cutting into the semiconductor structure shown in FIG. 10 from the upper surfaces of the bottom packages proximate the backsides of the dies 120. As the blade 315 travels toward the redistribution structure 140′, besides the remaining portion 140R of the redistribution structure 140′, the blade 315 does not contact the redistribution structure 140′ due to the openings 311/313 isolating the blade 315 from the redistribution structure 140′. As a result, cracking and/or delamination of the redistribution structure 140′ is avoided or reduced.

Although not shown, the pre-cut process and the dicing process illustrated in FIGS. 7-10 may be performed in other dicing regions, e.g., dicing regions between the PoP packages 500A/500B and other neighboring PoP packages (not shown). After the dicing process is finished, a plurality of individual PoP packages, such as the PoP package 500 illustrated in FIG. 11, are formed.

權利要求

1
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