Once cured and dried, the second redistribution passivation layer 507 may be patterned in order to form openings 523, which are filled with conductive materials that form the second redistribution passivation layer 507, to first redistribution layer 505. In an embodiment the patterning may be initiated by placing the package for which the second redistribution passivation layer 507 has been formed over into an optical lithography system for exposure.
Referring to FIG. 6, an optical lithography system 601 is presented. The optical lithography system 601 may include a light source 603, a light 605, a condense lens 607, a photomask 609, a mask stage 611, a projection lens 613, a package stage 619, a package 617 (schematically representing the components, such as the carrier substrate 101, the first and second semiconductor devices 201 and 301, the encapsulant 401, etc. that the second redistribution passivation layer 507 is formed over, as illustrated in FIGS. 5A and 5B), and a passivation layer 615 referred to henceforth as the second redistribution passivation layer 507. However, other configurations and inclusion or omission of the system 601 may be possible.