Metallic aluminum was then vapor-deposited in [a thickness of] 70 nm on the aforementioned film formed in Element B, thereby producing a cathode.
Without allowing it to touch the air, this laminate was placed in a glove box that had been replaced with nitrogen gas, and sealed using a glass sealing jar and a UV-setting adhesive (XNR5516HV, made by Nagase Chiba12). The element thus obtained was termed Element A. 12 Translator's note: “Nagase Chiba” is now called “Nagase ChemteX.”
The film (light-emitting layer) formed as described above was measured for its ART-IR deflection angle to calculate the order parameter (degree of orientation (S)) of the light-emitting material in the light-emitting layer of Element A and Element B.
Furthermore, C9220-02 absolute PL quantum efficiency measurement apparatus (made by Hamamatsu Photonics) was used to measure the quantum yield of each element, thereby measuring the absolute PL (photoluminescence) quantum efficiency of the Elements A and B that were produced. [The results were] termed PL (A) and PL (B), respectively.
The PL (A) and PL s(B) thus obtained were used to calculate the PL (photoluminescence) retention as follows: PL retention=PL(A)/PL(B)
In general, when a metal (such as the aforementioned metallic aluminum) is laminated, of the phosphorescent component that is generated through photoexcitation, the optical wave component that vibrates in a direction perpendicular to the metal is quenched by the metal, and therefore not released from the film to the outside, so the quantum yield/PL retention decreases. On the other hand, quenching decreases and PL retention increases (that is, the PL is maintained) when the light-emitting material is oriented.