The order parameter of the light-emitting material in the light-emitting layer in the present invention is at least 0.7. With regard to the order parameter of the light-emitting material in the light-emitting layer, for example, a washed quartz substrate is put in a vapor deposition device, a film is produced by vapor-depositing a material containing the light-emitting material, and the order parameter of the light-emitting material can be calculated by the aforementioned deflection measurement of ATR-IR, deflection measurement of photoluminescence, or another such method. A state in which the order parameter measured by a method such as these is at least 0.7 refers to a state in which the long-axis direction of the light-emitting material in the light-emitting layer and the direction of the horizontal plane of the substrate substantially coincide, or in the case of a planar light-emitting material, a state in which the plane of the light-emitting material and the direction of the horizontal plane of the substrate substantially coincide (that is, a state in which “the light-emitting material is oriented in the horizontal direction with the substrate”), and this significantly reduces the proportion of the emission of a component that undergoes quenching by metals when the element is used for organic electroluminescence.
The order parameter of the light-emitting material in the light-emitting layer in the present invention is preferably at least 0.7 and no more than 1.0, and more preferably at least 0.8 and no more than 1.0.