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Chip-scale radio-frequency localization devices and associated systems and methods

專利號(hào)
US11177554B2
公開日期
2021-11-16
申請(qǐng)人
Humatics Corporation(US MA Waltham)
發(fā)明人
Gregory L. Charvat; David A. Mindell
IPC分類
H01Q1/22; G01S13/87; H01Q1/52; H01Q3/36; H01Q9/04; H01Q9/27; G01S5/14; H01Q1/38; H01Q9/26; H04B5/00; H04W4/02; H04W56/00; H01Q1/24; H01Q5/10; G01S5/02; H04W64/00; G01S11/02
技術(shù)領(lǐng)域
rf,antenna,frequency,target,signals,transmit,receive,signal,may,circuitry
地域: MA MA Waltham

摘要

A device comprising: a substrate; a semiconductor die mounted on the substrate; a transmit antenna fabricated on the substrate and configured to transmit radio-frequency (RF) signals at least at a first center frequency; a receive antenna fabricated on the substrate and configured to receive RF signals at least at a second center frequency different than the first center frequency; and circuitry integrated with the semiconductor die and configured to provide RF signals to the transmit antenna and to receive RF signals from the receive antenna.

說明書

Antennas may be patterned on the substrate 522 in any suitable manner to produce a conductive pattern, for example, using any one or combination of various subtractive, additive and/or semi-additive processes. Subtractive processes selectively remove conductive material (e.g., copper) from a conductive layer of the substrate leaving a desired conductive pattern using, for example, any of various lithographic processes including, but not limited to, chemical etching, photoengraving, etc. Such processes are typically performed by providing a resist material in the desired pattern (often referred to as a mask) and introducing the conductive layer to the corresponding etchant to remove the conductive material in locations not treated with the resist material. Another subtractive process involves milling away unwanted portions of the conductive layer leaving the desired conductive pattern.

權(quán)利要求

1
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