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Chip-scale radio-frequency localization devices and associated systems and methods

專利號(hào)
US11177554B2
公開(kāi)日期
2021-11-16
申請(qǐng)人
Humatics Corporation(US MA Waltham)
發(fā)明人
Gregory L. Charvat; David A. Mindell
IPC分類
H01Q1/22; G01S13/87; H01Q1/52; H01Q3/36; H01Q9/04; H01Q9/27; G01S5/14; H01Q1/38; H01Q9/26; H04B5/00; H04W4/02; H04W56/00; H01Q1/24; H01Q5/10; G01S5/02; H04W64/00; G01S11/02
技術(shù)領(lǐng)域
rf,antenna,frequency,target,signals,transmit,receive,signal,may,circuitry
地域: MA MA Waltham

摘要

A device comprising: a substrate; a semiconductor die mounted on the substrate; a transmit antenna fabricated on the substrate and configured to transmit radio-frequency (RF) signals at least at a first center frequency; a receive antenna fabricated on the substrate and configured to receive RF signals at least at a second center frequency different than the first center frequency; and circuitry integrated with the semiconductor die and configured to provide RF signals to the transmit antenna and to receive RF signals from the receive antenna.

說(shuō)明書(shū)

In some embodiments, each of antennas 604 and 606 may be fabricated on substrate 602. For example, substrate 602 may comprise one or more conductive layers and each of antennas 604 and 606 may be fabricated on the substrate 602 at least in part by patterning the conductive layer(s). In some embodiments, antenna 604 may be configured to transmit RF signals circularly polarized in a first rotational direction (e.g., clockwise) and the antenna 606 may be configured to receive RF signals circularly polarized RF in a second rotational direction different from the first rotational direction (e.g., counter-clockwise). In other embodiments, however, each of antennas 604 and 606 may be configured to transmit and receive RF signals circularly polarized in the same rotational direction.

In some embodiments, the semiconductor die 608 may be a silicon die, for instance from a bulk silicon wafer or silicon-on-insulator (SOI) wafer. In some embodiments, the die 608 may be a single crystal silicon die. In some embodiments, the die 608 may be a CMOS die, a BiCMOS die, a GaAs die, a GaN die, or may be formed of any other suitable semiconductor material. In the illustrated embodiment, the die 608 is flip-chip bonded to substrate 602. In other embodiments, the die 608 may be wire bonded to the substrate 602 or mounted on substrate 602 in any other suitable way. In the illustrative embodiment of FIG. 6A, the semiconductor die 608 may be 1 mm by 1 mm.

權(quán)利要求

1
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