In the circuit board 10 according to the present disclosure, an arithmetic mean roughness Ra1 obtained from a roughness curve of a surface of the silicone-resin layer 4 may be larger than an arithmetic mean roughness Ra2 obtained from a roughness curve of a surface of the reflective layer 3. When such a composition is satisfied, light emitted from a light emitting element is easily reflected from the reflective layer 3 whose reflectance is higher than that of the silicone-resin layer 4. Thus, reflectance of the circuit board 10 according to the present disclosure is improved.

An arithmetic mean roughness Ra indicates a value prescribed in JIS B 0601-2013. The arithmetic mean roughness Ra is able to be obtained by measurement in compliance with JIS B 0601-2013. As measurement conditions, for example, a measurement length may be set to 2.5 mm, a Cut-off value may be set to 0.08 mm, a stylus whose stylus-radius is 2 μm may be used, and a scanning speed may be set to 0.6 mm/s. Furthermore, it is sufficient that at least three or more points are measured in each of the surfaces of the reflective layer 3 and the silicone-resin layer 4, and a corresponding average value is obtained.