What is claimed is:1. An electrical device, comprising:a softening polymer layer;an electrode layer on a surface of the softening polymer layer; anda cover polymer layer on the surface of the softening polymer layer, wherein:an opening in the polymer cover layer is filled with a reflowed solder,one end of the reflowed solder, located inside the opening, contacts a contact pad site portion of the electrode layer,another end of the reflowed solder contacts an electrical connector electrode of the device; andthe cover polymer layer is composed of a second softening polymer on the surface of the softening polymer layer, wherein an opening in the second softening polymer cover layer exposes a portion of a surface of the electrode layer, and wherein the softening polymer layer and the cover layer of the second softening polymer are composed of a softening polymer having a Young's modulus that decreases by more than 1 order of magnitude within a 30° C. temperature increase.2. The electrical device of claim 1, wherein the solder is a lead-free solder having equal to or less than 0.1% lead.3. The electrical device of claim 2, wherein the lead-free solder is composed of an indium silver solder.4. The electrical device of claim 3, wherein the indium silver solder has an indium:silver mole ratio of 97:3.5. The electrical device of claim 3, wherein the indium silver solder has melting point of 143° C.6. The electrical device of claim 3, wherein the indium silver solder further includes one or more of gold, tin or bismuth.7. The electrical device of claim 2, wherein the lead-free solder is composed of a tin, silver, indium alloy.8. The electrical device of claim 2, wherein the lead-free solder includes alloys of indium, silver, gold, tin and bismuth.9. The electrical device of claim 1, wherein the one end of the reflowed solder contacting the contact pad is free of a nickel adhesion and barrier layer.10. The electrical device of claim 1, wherein the other end of the reflowed solder contacting the electrical connector pad is free of a nickel adhesion and barrier layer.11. The electrical device of claim 1, wherein the electrical connector electrode is connected to one of a recording device, stimulating control device, a nano-Omnetics connector, a wireless chip or a metal wire.12. The electrical device of claim 1, wherein a mechanical neutral plane of the device is located at or above the surface of the softening polymer layer.13. The electrical device of claim 1, wherein the cover layer has a Young's modulus that is within ±10 percent of a Young's modulus of the softening polymer layer.14. The electrical device of claim 1, wherein the cover layer has a thickness that is within ±10 percent of a thickness of the softening polymer layer.15. The electrical device of claim 1, wherein the within 30° C. temperature increase is from a lower temperature of 20° C. to a higher temperature of 50° C.16. The electrical device of claim 1, wherein the within 30° C. temperature increase is from a lower temperature of 20° C. to a higher temperature of 37° C.