白丝美女被狂躁免费视频网站,500av导航大全精品,yw.193.cnc爆乳尤物未满,97se亚洲综合色区,аⅴ天堂中文在线网官网

Control method of inspection apparatus and inspection apparatus

專利號
US12075537B2
公開日期
2024-08-27
申請人
Tokyo Electron Limited(JP Tokyo)
發(fā)明人
Hiroaki Agawa
IPC分類
G01R31/28; H05B45/12; H05B45/40
技術(shù)領(lǐng)域
led,arrays,correction,correctors,wafer,c12,inspection,twelve,thermal,401a
地域: Tokyo

摘要

A control method of an inspection apparatus including a stage on which a substrate having an inspection object to be inspected is mounted and a plurality of light sources configured to emit light to heat the substrate includes: individually lighting the plurality of light sources and obtaining a plurality of first temperature distributions of the substrate; obtaining a second temperature distribution representing a sum of the plurality of first temperature distributions; obtaining one or more correction values for correcting an amount of light output from at least one or more light sources of the plurality of light sources based on the second temperature distribution; and correcting the amount of light output from each of the at least one or more light sources using the one or more correction values.

說明書

The controller 19A sets the correction values C1 to C12 to the respective twelve correctors 19B (step S7). Accordingly, the twelve correctors 19B output operation commands CiMV (i is 1 to 12) multiplied by the correction values C1 to C12. As a result, the light amounts of the LED arrays 400 (1) to (12) are corrected, and the amounts of heat by which the electronic device 500 is heated by the respective LED arrays 400 are corrected. Such correction values may be calculated and set, for example, when the inspection apparatus 10 is shipped from a factory or when maintenance of the inspection apparatus 10 is performed.

As described above, under the condition in which the target temperature represented by the temperature setting signal SV is set, the first thermal images are obtained while the electronic device 500 is heated by lighting (individually) the twelve LED arrays 400 one by one in the area 401. Then, the second thermal image representing the sum of the temperatures for each pixel in the area 401A of the twelve first thermal images is obtained. The second thermal image represents the temperature distribution in a state in which the twelve LED arrays 400 are lighted to heat the electronic device 500. Then, by performing the optimization calculation according to the equation (2) using the temperature TTotal obtained for each pixel in the area 401A in the second thermal image, under the condition in which the target temperature represented by the temperature setting signal SV is set, the combination of the correction values C1 to C12 at which the temperature difference T2 is minimized is obtained and set to the twelve correctors 19B.

權(quán)利要求

1
微信群二維碼
意見反饋