Accordingly, it is possible to provide the inspection apparatus 10 and the control method of the inspection apparatus 10 that enable to correct a control command so as to evenly heat the electronic device 500 that is an inspection object to be inspected.

In addition, since the first thermal images are obtained by the IR camera 200, the first temperature distributions can be easily obtained and the step of obtaining the correction values C1 to C12 can be simplified.

In addition, since the second thermal image is generated by taking the sum of the temperatures of each pixel of the twelve first thermal images obtained for the area 401, and the second temperature distribution represented by the second thermal image is obtained, the second temperature distribution can be accurately and efficiently obtained even when the number of LED arrays 400 is large.

Also, when obtaining the second temperature distribution, the second thermal image is generated by taking the sum of the temperatures of each pixel in the presence area 401A out of the pixels of the twelve first thermal images obtained for the area 401, and the second temperature distribution represented by the second thermal image is obtained. Therefore, the second temperature distribution can be more efficiently obtained.