Bit line structure, manufacturing method thereof and semiconductor memory
地域：
Hefei
摘要
A bit line structure, a manufacturing method thereof, and a semiconductor memory are provided. The bit line structure includes a first bit line array and a second bit line array. The first bit line array includes a plurality of first bit lines extending in a Y direction. The plurality of first bit lines have a same length and are aligned and arranged in an X direction. The second bit line array includes a plurality of second bit lines extending in the Y direction. The plurality of second bit lines have a same length and are aligned and arranged in the X direction. The first bit line array and the second bit line array are not aligned in the X direction. The X direction is perpendicular to the Y direction.
說明書
This is a continuation application of International Patent Application No. PCT/CN2021/079647, filed on Mar. 9, 2021, which claims priority to Chinese Patent Application No. 202010216030.1, filed on Mar. 25, 2020 and entitled “Bit Line Structure and Semiconductor Memory”. The disclosures of the International Patent Application No. PCT/CN2021/079647 and the Chinese Patent Application No. 202010216030.1 are incorporated by reference herein in their entireties.
The disclosure relates to a bit line structure, a manufacturing method thereof, and a semiconductor memory.
With the development of science and technology, people's requirement for a semiconductor technology is getting higher and higher, and the area of semiconductor devices is continuously reduced. Therefore, higher requirements are put forward for the precision and accuracy of a semiconductor manufacturing process. A semiconductor memory is a memory accessed by using a semiconductor circuit, where a Dynamic Random Access Memory (DRAM) is widely used in various fields with high storage speed and high integration level.
According to various embodiments, a first aspect of this disclosure provides a bit line structure, which may include: a first bit line array and a second bit line array.
The first bit line array includes a plurality of first bit lines extending in a Y direction. The plurality of first bit lines may have a same length and be aligned and arranged in an X direction.
權(quán)利要求
The invention claimed is:1. A bit line structure, comprising:a first bit line array, comprising a plurality of first bit lines extending in a Y direction, the plurality of first bit lines having a same length and being aligned and arranged in an X direction; and a second bit line array, comprising a plurality of second bit lines extending in the Y direction, the plurality of second bit lines having a same length and being aligned and arranged in the X direction; and, wherein the projection of the first bit line array and the projection of the second bit line array on a substrate are not aligned in the X direction, and the X direction is perpendicular to the Y direction; the plurality of first bit lines and the plurality of second bit lines are spaced apart from each other in the X direction; the plurality of first bit lines have first bit line contact structures on a positive side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a negative side of the Y direction; or the plurality of first bit lines have first bit line contact structures on a negative side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a positive side of the Y direction. 2. The bit line structure of claim 1 , wherein the plurality of first bit lines are equidistantly arranged at a set interval in the X direction, and the plurality of second bit lines are equidistantly arranged at a set interval in the X direction. 3. The bit line structure of claim 1 , wherein the first bit line contact structure and the second bit line contact structure have a same cross-sectional area. 4. The bit line structure of claim 1 , wherein the first bit line contact structure and the second bit line contact structure each have a rectangular, T-shaped, or semicircular cross-section. 5. The bit line structure of claim 4 , wherein adjacent T-shaped first bit line contact structures are arranged in opposite directions. 6. The bit line structure of claim 5 , wherein adjacent T-shaped second bit line contact structures are arranged in opposite directions. 7. The bit line structure of claim 1 , wherein an end of each of the first bit line contact structure and the second bit line contact structure is electrically connected with a drain of a transistor and an another end of each of the first bit line contact structure and the second bit line contact structure is electrically connected with a sense amplifier. 8. The bit line structure of claim 1 , wherein at least one of the first bit line contact structure and the second bit line contact structure is a grooved contact structure. 9. The bit line structure of claim 1 , wherein a material of the first bit line contact structure and a material of the second bit line contact structure each are one or more of tungsten, aluminum, copper, titanium, tantalum, or polysilicon. 10. A semiconductor memory, comprising:a bit line structure comprising: a first bit line array, comprising a plurality of first bit lines extending in a Y direction, the plurality of first bit lines having a same length and being aligned and arranged in an X direction; and a second bit line array, comprising a plurality of second bit lines extending in the Y direction, the plurality of second bit lines having a same length and being aligned and arranged in the X direction, wherein the projection of the first bit line array and the projection of the second bit line array on a substrate are not aligned in the X direction, and the X direction is perpendicular to the Y direction; and a memory cell, comprising a memory capacitor and a transistor, a gate of the transistor being connected to a word line, a drain of the transistor being connected to a bit line, and a source of the transistor being connected to the memory capacitor; and, wherein wherein a plurality of memory cells are arranged in an array consisting of M rows and N columns, the memory cells in a same row share one word line, the memory cells in a same column share one bit line, the bit line has the bit line structure, and both M and N are positive integers; the plurality of first bit lines and the plurality of second bit lines are:spaced apart from each other in the X direction; have first bit line contact structures on a positive side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a negative side of the Y direction; or have first bit line contact structures on a negative side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a positive side of the Y direction. 11. A manufacturing method of a bit line structure, comprising:providing a substrate, an isolation structure and an active region being formed in the substrate; forming an interlayer dielectric layer and a hard mask layer on a surface of the substrate; patterning the hard mask layer, and etching the interlayer dielectric layer through the patterned hard mask layer to form bit line contact grooves, wherein the patterned hard mask layer has a pattern same as a pattern of bit lines; filling the bit line contact grooves with a conductive material to form first bit line contact structures and second bit line contact structures; and forming a bit line metal layer on surfaces of the first bit line contact structure, the second bit line contact structure, and the interlayer dielectric layer, and patterning the bit line metal layer to form a first bit line array and a second bit line array; and wherein the filling the bit line contact grooves with the conductive material comprises: depositing the conductive material in the bit line contact grooves to form conductive material layers, wherein a top of the conductive material layer is higher than a top of the interlayer dielectric layer; and planarizing the conductive material layers to remove the conductive material layers higher than the interlayer dielectric layer and the remaining hard mask layer, remaining conductive material layers serving as the first bit line contact structures and the second bit line contact structures, wherein the first bit line array comprises a plurality of first bit lines extending in a Y direction, the plurality of first bit lines having a same length and being aligned and arranged in an X direction, and the second bit line array comprises a plurality of second bit lines extending in the Y direction, the plurality of second bit lines having a same length and being aligned and arranged in the X direction, and wherein the projection of the first bit line array and the projection of the second bit line array on a substrate are not aligned in the X direction, and the X direction is perpendicular to the Y direction; and the plurality of first bit lines and the plurality of second bit lines:are spaced apart from each other in the X direction; contact structures on a positive side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a negative side of the Y direction; or have first bit line contact structures on a negative side of the Y direction, and the plurality of second bit lines have second bit line contact structures on a positive side of the Y direction. 12. The manufacturing method of claim 11 , wherein the forming the isolation structure comprises:etching a trench in the substrate; filling the trench with a dielectric substance; and planarizing a wafer surface by using a chemical mechanical polishing method. 13. The manufacturing method of claim 11 , wherein a material of the interlayer dielectric layer is silicon nitride, silicon oxide, or silicon oxynitride. 14. The manufacturing method of claim 11 , wherein a material of the hard mask layer is at least one of silicon oxide, silicon nitride, silicon carbide, silicon oxynitride, silicon carbonitride, or silicon oxycarbonitride. 15. The manufacturing method of claim 11 , wherein a material of the bit line metal layer is one or more of tungsten, aluminum, titanium, tantalum, or polysilicon.
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