For example, the maximum size of the orthographic projection of the cover plate alignment mark 14 on the base substrate 11 ranges from about 150 microns to 600 microns, such as 300 microns to 500 microns. For example, each of the plurality of cover plate alignment marks 14 in FIG. 1A has a maximum size in the second direction y, and the maximum size ranges from about 150 microns to 600 microns, such as 300 microns to 500 microns, such as about 150 microns, 200 microns, 250 microns, 300 microns, 350 microns, 400 microns, 450 microns, 500 microns, or 550 microns. By making the cover plate alignment mark 14 have a larger size, it is beneficial for the alignment device to identify the cover plate alignment mark 14, thereby improving the alignment accuracy. It should be noted that “about” here refers to being within the allowable error range of the manufacturing process. For example, the maximum design size of the cover plate alignment mark 14 is d, which ranges from 150 microns to 600 microns (e.g., 300 microns to 500 microns). However, due to the influence of the manufacturing process, the actual maximum size of the manufactured cover plate alignment mark 14 may slightly deviate from the maximum design size, and the difference between the actual maximum size and the maximum design size of the cover plate alignment mark 14 in this embodiment of the present disclosure meets the requirements of the allowable error range. In addition, the allowable error range can be set according to actual needs, so it will not be repeated here.
