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Method for manufacturing a semiconductor storage device including a division film

專利號
US12185539B2
公開日期
2024-12-31
申請人
Kioxia Corporation(JP Tokyo)
發(fā)明人
Kazuharu Yamabe; Yoshiro Shimojo
IPC分類
H10B43/27
技術(shù)領(lǐng)域
columnar,film,insulating,sgdo,cl2a,cl2b,body,stacked,conductive,bodies
地域: Tokyo

摘要

In a method for manufacturing a memory, a first stacked body is formed by stacking a first insulating film and a first sacrificial film. A first columnar body including a first semiconductor portion extending in the first stacked body in the first direction and a charge trapping film provided on an outer peripheral surface of the first semiconductor portion is formed. A second columnar body provided in a second direction of the first columnar body and including a second semiconductor portion stretching in the first stacked body in the first direction and a charge trapping film on an outer peripheral surface of the second semiconductor portion is formed. A second insulating film is formed above the first stacked body. A third columnar body including a third semiconductor portion provided on both the first columnar body and the second columnar body and stretching in the second insulating film in the first direction and a first gate insulating film provided on an outer peripheral surface of the third semiconductor portion is formed. A first division insulating film extending in the first direction and a third direction intersecting the first direction and the second direction and dividing the third semiconductor portion of the third columnar body in the second direction is formed.

說明書

Next, as illustrated in FIGS. 7A and 7B, the hole SH2 is formed in the second stacked body 2a from above the second stacked body 2a by using a lithography technique, an etching technique, or the like. FIG. 7B corresponds to a cross section taken along line D-D of FIG. 7A. Here, the hole SH2 is formed up to the interlayer insulating film 33 which is the etching stopper of the third stacked body 3a. In the region where the columnar body CL3 is provided, the hole SH2 is formed up to the semiconductor portion 302. As illustrated in FIG. 7A, the hole SH2 is formed in a substantially oblate shape, a substantially elliptical shape, or a substantially rectangular shape having a major axis or a minor axis in a direction inclined with respect to the X and Y directions in a plan view seen from the Z direction.

權(quán)利要求

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