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Semiconductor devices with threshold voltage modulation layer

專利號
US12213297B2
公開日期
2025-01-28
申請人
Taiwan Semiconductor Manufacturing Company, Ltd.(TW Hsinchu)
發(fā)明人
Shih-Hao Lin; Chih-Hsiang Huang; Shang-Rong Li; Chih-Chuan Yang; Jui-Lin Chen; Ming-Shuan Li
IPC分類
H01L21/8238; H01L21/02; H01L21/28; H01L29/06; H01L29/423; H01L29/49; H01L29/66; H01L29/786; H10B10/00
技術領域
layer,fins,wfm,layers,gate,vt,capping,in,channel,stacks
地域: Hsin-Chu

摘要

A method comprises forming a first fin including alternating first channel layers and first sacrificial layers and a second fin including alternating second channel layers and second sacrificial layers, forming a capping layer over the first and the second fin, forming a dummy gate stack over the capping layer, forming source/drain (S/D) features in the first and the second fin, removing the dummy gate stack to form a gate trench, removing the first sacrificial layers and the capping layer over the first fin to form first gaps, removing the capping layer over the second fin and portions of the second sacrificial layers to from second gaps, where remaining portions of the second sacrificial layers and the capping layers form a threshold voltage (Vt) modulation layer, and forming a metal gate stack in the gate trench, the first gaps, and the second gaps.

說明書

In the embodiments depicted in FIGS. 26A and 26B, the Vt modulation layer 218 covers the top surfaces, the bottom surfaces, and the sidewalls of the channel layers 207 and the base fins 204B. The channel layers 207 directly contact the Vt modulation layer 118 without any sacrificial layers 205 disposed therebetween. The Vt modulation layer 118 has a thickness t5, while the thickness of the channel layers 207 together with the Vt modulation layer 118 wrapped thereover is referred to as a2. In some embodiments, the thickness t5 is different from (e.g., less than) the thickness t4 and the thickness a2 is different from (e.g., less than) the thickness a. In the present embodiments, the thickness t5 equals to or substantially equals to the thickness t4, and the thickness a2 equals or substantially equals to a. In the present embodiments, the thickness t5 is about 10% to about 50% of the thickness a1. In the present embodiments, the thickness t5 is selected to effectively fine tune (or modulate) the Vt. If the thickness t5 is too thin (e.g., less than 10% of the thickness a1), the Vt modulation layer 218 may not be able to modulate the Vt effectively. On the other hand, if the thickness t5 is too thick (e.g., greater than 50% of the thickness a1), the opening 211 may be too narrow to form the various layers of the gate stack 620 in the subsequent processes.

權利要求

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