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Integrated chip with a gate structure disposed within a trench

專利號(hào)
US12219770B2
公開日期
2025-02-04
申請(qǐng)人
Taiwan Semiconductor Manufacturing Company, Ltd.(TW Hsinchu)
發(fā)明人
Yong-Sheng Huang; Ming Chyi Liu
IPC分類
H10B43/30; H01L21/28; H01L29/06; H01L29/08; H01L29/423; H01L29/792; H10B41/30; H10B43/40
技術(shù)領(lǐng)域
gate,dielectric,substrate,region,layer,102t1,102f,102t2,trench,drain
地域: Hsinchu

摘要

The present disclosure relates to an integrated chip comprising a substrate having a first pair of opposing sidewalls that define a trench. The trench extends into a front-side surface of the substrate. A first source/drain region is disposed along the front-side surface of the substrate. A second source/drain region is disposed along the front-side surface of the substrate. A gate structure is disposed within the trench and is arranged laterally between the first source/drain region and the second source/drain region. The gate structure fills the trench and extends along the first pair of opposing sidewalls to an upper surface of the substrate. A bottom surface of the gate structure is disposed below a bottom surface of the first source/drain region.

說明書

The integrated chip 200a includes a first memory cell 202a and a second memory cell 202b disposed laterally within a memory region 102a of the substrate 102. In various embodiments, the substrate 102 may, for example, be or comprise a bulk substrate (e.g., bulk silicon), a silicon-on-insulator (SOI) substrate, or another suitable substrate and/or may comprise a first doping type (e.g., p-type). Further, the substrate 102 comprises a first pair of opposing sidewalls that define the first trench 102t1 and a second pair of opposing sidewalls that define the second trench 102t2. The first trench 102t1 and the second trench 102t2 extend into a front-side surface 102f of the substrate 102 and are laterally offset from one another by a non-zero distance.

權(quán)利要求

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