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Integrated chip with a gate structure disposed within a trench

專利號(hào)
US12219770B2
公開(kāi)日期
2025-02-04
申請(qǐng)人
Taiwan Semiconductor Manufacturing Company, Ltd.(TW Hsinchu)
發(fā)明人
Yong-Sheng Huang; Ming Chyi Liu
IPC分類
H10B43/30; H01L21/28; H01L29/06; H01L29/08; H01L29/423; H01L29/792; H10B41/30; H10B43/40
技術(shù)領(lǐng)域
gate,dielectric,substrate,region,layer,102t1,102f,102t2,trench,drain
地域: Hsinchu

摘要

The present disclosure relates to an integrated chip comprising a substrate having a first pair of opposing sidewalls that define a trench. The trench extends into a front-side surface of the substrate. A first source/drain region is disposed along the front-side surface of the substrate. A second source/drain region is disposed along the front-side surface of the substrate. A gate structure is disposed within the trench and is arranged laterally between the first source/drain region and the second source/drain region. The gate structure fills the trench and extends along the first pair of opposing sidewalls to an upper surface of the substrate. A bottom surface of the gate structure is disposed below a bottom surface of the first source/drain region.

說(shuō)明書

Many integrated chips include memory cells disposed along a substrate. For example, an integrated chip may comprise a split-gate flash memory cell disposed along a substrate and disposed laterally within a memory region of the substrate. The memory cell includes a first source/drain region and a second source/drain region that are disposed along a horizontal top surface of a substrate and that are laterally separated from each other by a channel region of the substrate. A gate structure is disposed over the top surface of the substrate and is arranged between the first source/drain region and the second source/drain region. The gate structure includes a select gate and a memory gate that is laterally adjacent to the select gate. The select gate is vertically separated from the channel region by a select gate dielectric layer and the memory gate is vertically separated from the channel region by a charge trapping dielectric structure. A length of the channel region is proportional to a length of the top surface of the substrate that extends between the first and second source/drain regions. Further, the integrated chip may include a plurality of logic devices disposed within a logic region of the substrate that is directly adjacent to the memory region of the substrate. The logic devices may each comprise a logic gate disposed over the top surface of the substrate.

權(quán)利要求

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